FOR 2093

2019

Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
Neelisetty, K., Mu, X., Gutsch, S., Vahl, A., Molinari, A., Von Seggern, F., Hansen, M., Scherer, T., Zacharias, M., Kienle, L., Chakravadhanula, V. S. K., Kübel, C.
Microscopy and Microanalysis 25(3) (2019)

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing
Mahadevaiah, M. K, Perez, E., Wenger, Ch., Grossi, A., Zambelli, C., Olivo, P., Zahari, F., Kohlstedt, H., Ziegler, M.
IEEE International Reliability Physics Symposium (IRPS) (2019)

A stress sensor based on a silicon field effect transistor comprising a piezoelectric AlN gate dielectric
Winterfeld, H., Thormählen, L., Lewitz, H., Yarar, E., Birkoben, T., Niethe, N., Preinl, N., Hanssen, H., Quandt, E., Kohlstedt, H.
J Mater Sci: Mater Electron (2019)

Towards Wave Digital Memcomputing with Physical Memristor Models
Ochs, K., Solan, E., Michaelis, D., Herbrechter, M.
IEEE International Symposium on Circuits and Systems (ISACS) (2019)

Inherent stochastic learning in CMOS integrated HfO2 arrays for neuromorphic computing
Wenger, Ch., Zahari, F., Mahadevaiah, M. K., Perez, E., Beckers, I., Kohlstedt, H., Ziegler, M.
IEEE Electron Device Letters 40(4) (2019)

Concept and modelling of memsensors as two terminal devices with enhanced capabilities in neuromorphic engineering
Vahl, A., Carstensen, J., Kaps, S., Lupan, O., Strunskus, T., Adelung, R., Faupel, F.
Scientific Reports 9, 4361 (2019)

Data retention investigation in Al:HfO2-based resistive random access memory arrays by using high-temperature accelerated tests
Perez, E., Mahadevaiah, M.K., Zambelli, C., Olivo, P., Wenger, Ch
Journal of Vacuum Science and Technology B 37, 012202 (2019)

Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy
Niu, G., Calka, P., Huang, P., Sharath, S. U., Petzold, S., Gloskovskii, A., Fröhlich, K., Zhao, Y., Kang, J., Schubert, M. A., Bärwolf, F., Ren, W., Ye, Z.-G, Perez, E., Wenger, Ch., Alff, L., Schroeder, T.
Materials Research Letters 7(3) (2019)